TY  - RPRT
TI  - The Impact of Using Regression Models to Build Defect Classifiers
AU  - Gopi Krishnan Rajbahadur
AU  - Shaowei Wang
AU  - Yasutaka Kamei
AU  - Ahmed E. Hassan
PY  - 2022
DO  - 10.1109/msr.2017.4
UR  - https://arxiv.org/abs/2202.06157
ID  - 2202.06157
ER  -