TY  - RPRT
TI  - In-situ force microscopy to investigate fracture in stretchable electronics: insights on local surface mechanics and conductivity
AU  - Giorgio Cortelli
AU  - Luca Patruno
AU  - Tobias Cramer
AU  - Beatrice Fraboni
AU  - Stefano de Miranda
PY  - 2022
DO  - 10.1021/acsaelm.2c00328
UR  - https://arxiv.org/abs/2202.10119
ID  - 2202.10119
ER  -