@misc{indiciae121ca44d8c2b,
  title = {Automatic Test Pattern Generation for Robust Quantum Circuit Testing},
  author = {Kean Chen and Mingsheng Ying},
  year = {2024},
  doi = {10.1145/3689333},
  url = {https://arxiv.org/abs/2202.10697},
  note = {Source identifier: 2202.10697}
}