@misc{indiciae516a1cb3f56d,
  title = {FinFET and Nanowire SRAM Radiation Hardness Studies using Ab initio-TCAD Simulation Framework},
  author = {Johan Saltin and Adam Elwailly and Hiu Yung Wong},
  year = {2022},
  url = {https://arxiv.org/abs/2202.13769},
  note = {Source identifier: 2202.13769}
}