TY  - RPRT
TI  - FinFET and Nanowire SRAM Radiation Hardness Studies using Ab initio-TCAD Simulation Framework
AU  - Johan Saltin
AU  - Adam Elwailly
AU  - Hiu Yung Wong
PY  - 2022
UR  - https://arxiv.org/abs/2202.13769
ID  - 2202.13769
ER  -