@misc{indiciaed8150d1638be,
  title = {Deep learning applications for quality control in particle detector construction},
  author = {N. Akchurin and J. Damgov and S. Dugad and P. G C and S. Grönroos and K. Lamichhane and J. Martinez and T. Quast and S. Undleeb and A. Whitbeck},
  year = {2022},
  url = {https://arxiv.org/abs/2203.08969},
  note = {Source identifier: 2203.08969}
}