@misc{indiciaecbc5282706e1,
  title = {X-ray Nano-imaging of Defects in Thin Film Catalysts via Cluster Analysis},
  author = {Aileen Luo and Oleg Yu. Gorobtsov and Jocienne N. Nelson and Ding-Yuan Kuo and Ziming Shao and Ryan Bouck and Mathew Cherukara and Martin V. Holt and Kyle M. Shen and Darrell G. Schlom and Jin Suntivich and Andrej Singer},
  year = {2023},
  doi = {10.1063/5.0125268},
  url = {https://arxiv.org/abs/2203.09980},
  note = {Source identifier: 2203.09980}
}