@misc{indiciae3d009880ace1,
  title = {Temperature mapping of stacked silicon dies from x-ray diffraction intensities},
  author = {Darshan Chalise and Peter Kenesei and Sarvjit D. Shastri and David G. Cahill},
  year = {2022},
  doi = {10.1103/physrevapplied.18.014076},
  url = {https://arxiv.org/abs/2203.12554},
  note = {Source identifier: 2203.12554}
}