TY  - RPRT
TI  - Temperature mapping of stacked silicon dies from x-ray diffraction intensities
AU  - Darshan Chalise
AU  - Peter Kenesei
AU  - Sarvjit D. Shastri
AU  - David G. Cahill
PY  - 2022
DO  - 10.1103/physrevapplied.18.014076
UR  - https://arxiv.org/abs/2203.12554
ID  - 2203.12554
ER  -