@misc{indiciaeda8c0f6964fb,
  title = {Deep Learning based Intelligent Coin-tap Test for Defect Recognition},
  author = {Hongyu Li and Peng Jiang and Tiejun Wang},
  year = {2022},
  url = {https://arxiv.org/abs/2203.12594},
  note = {Source identifier: 2203.12594}
}