TY  - RPRT
TI  - Geometric model of crack-templated networks for transparent conductive films
AU  - Jaeuk Kim
AU  - Thomas M. Truskett
PY  - 2022
DO  - 10.1063/5.0092946
UR  - https://arxiv.org/abs/2203.13428
ID  - 2203.13428
ER  -