@misc{indiciae43775c24f216,
  title = {Nanoscale mapping of the full strain tensor, rotation and composition in partially relaxed In\$\_x\$Ga\$\_\{1-x\}\$N layers by scanning X-ray diffraction microscopy},
  author = {Carsten Richter and Vladimir M. Kaganer and Armelle Even and Amélie Dussaigne and Pierre Ferret and Frédéric Barbier and Yves-Matthieu Le Vaillant and Tobias U. Schülli},
  year = {2022},
  url = {https://arxiv.org/abs/2203.14819},
  note = {Source identifier: 2203.14819}
}