TY  - RPRT
TI  - Growth at high substrate coverage can decrease the grain boundary roughness of 2D materials
AU  - Fabio D. A. Aarão Reis
AU  - Bastien Marguet
AU  - Olivier Pierre-Louis
PY  - 2022
UR  - https://arxiv.org/abs/2204.01894
ID  - 2204.01894
ER  -