TY  - RPRT
TI  - Chemical state analysis of reactively sputtered zinc vanadium nitride: The Auger parameter as a tool in materials design
AU  - Siarhei Zhuk
AU  - Sebastian Siol
PY  - 2022
DO  - 10.1016/j.apsusc.2022.154172
UR  - https://arxiv.org/abs/2204.05401
ID  - 2204.05401
ER  -