@misc{indiciaec17a70d6c2c3,
  title = {A Comprehensive Test Pattern Generation Approach Exploiting SAT Attack for Logic Locking},
  author = {Yadi Zhong and Ujjwal Guin},
  year = {2023},
  url = {https://arxiv.org/abs/2204.11307},
  note = {Source identifier: 2204.11307}
}