TY  - RPRT
TI  - Robust inference for non-destructive one-shot device testing under step-stress model with exponential lifetimes
AU  - Narayanaswamy Balakrishnan
AU  - Elena Castilla
AU  - María Jaenada
AU  - Leandro Pardo
PY  - 2022
UR  - https://arxiv.org/abs/2204.11560
ID  - 2204.11560
ER  -