TY  - RPRT
TI  - Optical microscope based universal parameter for identifying layer number in two-dimensional materials
AU  - Mainak Mondal
AU  - Ajit Kumar Dash
AU  - Akshay Singh
PY  - 2022
DO  - 10.1021/acsnano.2c04833
UR  - https://arxiv.org/abs/2204.12745
ID  - 2204.12745
ER  -