TY  - RPRT
TI  - Identifying Cause-and-Effect Relationships of Manufacturing Errors using Sequence-to-Sequence Learning
AU  - Jeff Reimer
AU  - Yandong Wang
AU  - Sofiane Laridi
AU  - Juergen Urdich
AU  - Sören Wilmsmeier
AU  - Gregory Palmer
PY  - 2022
UR  - https://arxiv.org/abs/2205.02827
ID  - 2205.02827
ER  -