@misc{indiciae01d1bea17c2a,
  title = {Can a Programmable Phase Plate Serve as an Aberration Corrector in the Transmission Electron Microscope (TEM)?},
  author = {Francisco Vega Ibáñez and Armand Béché and Johan Verbeeck},
  year = {2022},
  doi = {10.1017/s1431927622012260},
  url = {https://arxiv.org/abs/2205.07697},
  note = {Source identifier: 2205.07697}
}