TY  - RPRT
TI  - Interfacial properties of 2D WS2 on SiO2 substrate from x-ray photoelectron spectroscopy and first-principles calculations
AU  - Changjie Zhou
AU  - Huili Zhu
AU  - Weifeng Yang
AU  - Qiubao Lin
AU  - Tongchang Zheng
AU  - Lan Yang
AU  - Shuqiong Lan
PY  - 2022
UR  - https://arxiv.org/abs/2205.08994
ID  - 2205.08994
ER  -