@misc{indiciaeb7e742c65978,
  title = {Application of Orthogonal Defect Classification for Software Reliability Analysis},
  author = {Edward Chen and Han Bao and Tate Shorthill and Carl Elks and Athira Varma Jayakumar and Nam Dinh},
  year = {2022},
  url = {https://arxiv.org/abs/2205.12080},
  note = {Source identifier: 2205.12080}
}