TY  - RPRT
TI  - Application of Orthogonal Defect Classification for Software Reliability Analysis
AU  - Edward Chen
AU  - Han Bao
AU  - Tate Shorthill
AU  - Carl Elks
AU  - Athira Varma Jayakumar
AU  - Nam Dinh
PY  - 2022
UR  - https://arxiv.org/abs/2205.12080
ID  - 2205.12080
ER  -