@misc{indiciaebd865ff2ad66,
  title = {Overcoming contrast reversals in focused probe ptychography of thick materials: an optimal pipeline for efficiently determining local atomic structure in materials science},
  author = {C. Gao and C. Hofer and D. Jannis and A. Béché and J. Verbeeck and T. J. Pennycook},
  year = {2022},
  doi = {10.1063/5.0101895},
  url = {https://arxiv.org/abs/2205.13308},
  note = {Source identifier: 2205.13308}
}