TY - RPRT TI - Electrical evolution of W and WC Schottky contacts on 4H-SiC at different annealing temperatures AU - Marilena Vivona AU - Gabriele Bellocchi AU - Raffaella Lo Nigro AU - Simone RascunĂ¡ AU - Fabrizio Roccaforte PY - 2022 DO - 10.1088/1361-6641/ac3375 UR - https://arxiv.org/abs/2205.14985 ID - 2205.14985 ER -