TY  - RPRT
TI  - An extraction method for mobility degradation and contact resistance of graphene transistors
AU  - Anibal Pacheco-Sanchez
AU  - Nikolaos Mavredakis
AU  - Pedro C. Feijoo
AU  - David Jiménez
PY  - 2022
DO  - 10.1109/ted.2022.3176830
UR  - https://arxiv.org/abs/2206.00644
ID  - 2206.00644
ER  -