@misc{indiciae2a8dd6c51d6c,
  title = {Defect Profiling of Oxide-Semiconductor Interfaces Using Low-Energy Muons},
  author = {Maria Inês Mendes Martins and Piyush Kumar and Judith Woerle and Xiaojie Ni and Ulrike Grossner and Thomas Prokscha},
  year = {2022},
  url = {https://arxiv.org/abs/2206.00925},
  note = {Source identifier: 2206.00925}
}