TY  - RPRT
TI  - Defect Profiling of Oxide-Semiconductor Interfaces Using Low-Energy Muons
AU  - Maria Inês Mendes Martins
AU  - Piyush Kumar
AU  - Judith Woerle
AU  - Xiaojie Ni
AU  - Ulrike Grossner
AU  - Thomas Prokscha
PY  - 2022
UR  - https://arxiv.org/abs/2206.00925
ID  - 2206.00925
ER  -