TY  - RPRT
TI  - Structural Analysis of Si(OEt)4 Deposits on Au(111)/SiO2 Substrates at Nanometer Scale using Focused Electron Beam Induced Deposition
AU  - Po-Shi Yuan
AU  - Nigel Mason
AU  - Maria Pintea
AU  - Csarnovics István
AU  - Tamás Fodor
PY  - 2022
UR  - https://arxiv.org/abs/2206.01422
ID  - 2206.01422
ER  -