TY  - RPRT
TI  - Laser-induced crystallization of copper oxide thin films: A comparison made between Gaussian and chevron-beam profiles provides a clue for the failure of Gaussian-beam profile
AU  - Willam Bodeau
AU  - Kaisei Otoge
AU  - Wenchang Yeh
AU  - Nobuhiko P. Kobayashi
PY  - 2022
DO  - 10.1021/acsami.2c11412
UR  - https://arxiv.org/abs/2206.02532
ID  - 2206.02532
ER  -