TY  - RPRT
TI  - Modeling Defect-Level Switching for Highly-Nonlinear and Hysteretic Electronic Devices
AU  - Jiahao Dong
AU  - R. Jaramillo
PY  - 2024
DO  - 10.1063/5.0197121
UR  - https://arxiv.org/abs/2206.04108
ID  - 2206.04108
ER  -