TY  - RPRT
TI  - Grain Boundary Development of Silicon during Directional Solidification: A Phase-Field Study
AU  - Chuanqi Zhu
AU  - Yuichiro Koizumi
AU  - Chunwen Guo
PY  - 2022
UR  - https://arxiv.org/abs/2206.04895
ID  - 2206.04895
ER  -