TY  - RPRT
TI  - Scaleability of dielectric susceptibility $ε_{zz}$ with the number of layers and additivity of ferroelectric polarization in van der Waals semiconductors
AU  - Fábio Ferreira
AU  - Vladimir Enaldiev
AU  - Vladimir Fal'ko
PY  - 2022
DO  - 10.1103/physrevb.106.125408
UR  - https://arxiv.org/abs/2206.09183
ID  - 2206.09183
ER  -