TY  - RPRT
TI  - Efficient and accurate defect level modelling in monolayer MoS$_2$ via GW+DFT with open boundary conditions
AU  - Guido Gandus
AU  - Youseung Lee
AU  - Leonard Deuschle
AU  - Mathieu Luisier
AU  - Daniele Passerone
PY  - 2022
DO  - 10.1016/j.sse.2022.108499
UR  - https://arxiv.org/abs/2206.14512
ID  - 2206.14512
ER  -