@misc{indiciaeaaab3fe7f758,
  title = {Investigating charge trapping in ferroelectric thin films through transient measurements},
  author = {Suzanne Lancaster and Patrick D Lomenzo and Moritz Engl and Bohan Xu and Thomas Mikolajick and Uwe Schroeder and Stefan Slesazeck},
  year = {2022},
  doi = {10.3389/fnano.2022.939822},
  url = {https://arxiv.org/abs/2206.14593},
  note = {Source identifier: 2206.14593}
}