TY  - RPRT
TI  - WaferSegClassNet -- A Light-weight Network for Classification and Segmentation of Semiconductor Wafer Defects
AU  - Subhrajit Nag
AU  - Dhruv Makwana
AU  - Sai Chandra Teja R
AU  - Sparsh Mittal
AU  - C Krishna Mohan
PY  - 2022
DO  - 10.1016/j.compind.2022.103720
UR  - https://arxiv.org/abs/2207.00960
ID  - 2207.00960
ER  -