TY  - RPRT
TI  - Mottness in two-dimensional van der Waals Nb$_3$X$_8$ monolayers (X=Cl, Br, and I)
AU  - Yi Zhang
AU  - Yuhao Gu
AU  - Hongming Weng
AU  - Kun Jiang
AU  - Jiangping Hu
PY  - 2023
DO  - 10.1103/physrevb.107.035126
UR  - https://arxiv.org/abs/2207.01471
ID  - 2207.01471
ER  -