@misc{indiciaeec7eff5b56c2,
  title = {Non-destructive Depth-Resolved Characterization of Residual Strain Fields in High Electron Mobility Transistors using Differential Aperture X-ray Microscopy},
  author = {Darren C. Pagan and Md Abu Jafar Rasel and Rachel E. Lim and Dina Sheyfer and Wenjun Liu and Aman Haque},
  year = {2022},
  doi = {10.1063/5.0109606},
  url = {https://arxiv.org/abs/2207.05789},
  note = {Source identifier: 2207.05789}
}