TY  - RPRT
TI  - Non-destructive Depth-Resolved Characterization of Residual Strain Fields in High Electron Mobility Transistors using Differential Aperture X-ray Microscopy
AU  - Darren C. Pagan
AU  - Md Abu Jafar Rasel
AU  - Rachel E. Lim
AU  - Dina Sheyfer
AU  - Wenjun Liu
AU  - Aman Haque
PY  - 2022
DO  - 10.1063/5.0109606
UR  - https://arxiv.org/abs/2207.05789
ID  - 2207.05789
ER  -