TY  - RPRT
TI  - Determination of Thickness-dependent Damping Constant and Plasma Frequency for Ultrathin Ag and Au Films: Nanoscale Dielectric Function
AU  - Luis J. Mendoza Herrera
AU  - Myrian C. Tebaldi
AU  - Lucía B. Scaffardi
AU  - Daniel C. Schinca
PY  - 2022
DO  - 10.1039/d2cp04286j
UR  - https://arxiv.org/abs/2207.13580
ID  - 2207.13580
ER  -