@misc{indiciaec24e44ab01c0,
  title = {Low-Energy Electron Microscopy contrast of stacking boundaries: comparing twisted few-layer graphene and strained epitaxial graphene on silicon carbide},
  author = {Tobias A. de Jong and Xingchen Chen and Johannes Jobst and Eugene E. Krasovskii and Ruud M. Tromp and Sense Jan van der Molen},
  year = {2022},
  doi = {10.1103/physrevb.107.075431},
  url = {https://arxiv.org/abs/2207.14616},
  note = {Source identifier: 2207.14616}
}