TY  - RPRT
TI  - Low-Energy Electron Microscopy contrast of stacking boundaries: comparing twisted few-layer graphene and strained epitaxial graphene on silicon carbide
AU  - Tobias A. de Jong
AU  - Xingchen Chen
AU  - Johannes Jobst
AU  - Eugene E. Krasovskii
AU  - Ruud M. Tromp
AU  - Sense Jan van der Molen
PY  - 2022
DO  - 10.1103/physrevb.107.075431
UR  - https://arxiv.org/abs/2207.14616
ID  - 2207.14616
ER  -