TY  - RPRT
TI  - Proton induced Dark Count Rate degradation in 150-nm CMOS Single-Photon Avalanche Diodes
AU  - M. Campajola
AU  - F. Di Capua
AU  - D. Fiore
AU  - E. Sarnelli
AU  - A. Aloisio
PY  - 2022
DO  - 10.1016/j.nima.2019.162722
UR  - https://arxiv.org/abs/2208.01109
ID  - 2208.01109
ER  -