@misc{indiciae132278bff2dd,
  title = {Thermal Testing for Cryogenic CMB Instrument Optical Design},
  author = {D. C. Goldfinger and P. A. R. Ade and Z. Ahmed and M. Amiri and D. Barkats and R. Basu Thakur and D. Beck and C. A. Bischoff and J. J. Bock and V. Buza and J. Cheshire and J. Connors and J. Cornelison and M. Crumrine and A. J. Cukierman and E. V. Denison and M. I. Dierickx and L. Duband and M. Eiben and S. Fatigoni and J. P. Filippini and C. Giannakopoulos and N. Goeckner-Wald and J. Grayson and P. K. Grimes and G. Hall and G. Halal and M. Halpern and E. Hand and S. A. Harrison and S. Henderson and S. R. Hildebrandt and G. C. Hilton and J. Hubmayk and H. Hui and K. D. Irwin and J. Kang and K. S. Karkare and S. Kefeli and J. M. Kovac and C. L. Kuo and K. Lau and E. M. Leitch and A. Lennox and T. Liu and K. G. Megerian and L. Minutolo and L. Moncelsi and Y. Nakato and T. Namikawa and H. T. Nguyen and R. O'Brient and S. Palladino and M. A. Petroff and T. Prouve and C. Pryke and B. Racine and C. D. Reintsema and M. Salatino and A. Schillaci and B. L. Schmitt and B. Singari and A. Soliman and A. G. Smith and T. St. Germaine and B. Steinbach and R. V. Sudiwala and K. L. Thompson and C. Tsai and C. Tucker and A. D. Turner and C. Umiltà and C. Vergès and A. G. Vieregg and A. Wandui and A. C. Weber and D. V. Wiebe and J. Willmert and W. L. K. Wu and H. Yang and K. W. Yoon and E. Young and C. Yu and L. Zeng and C. Zhang and S. Zhang},
  year = {2022},
  url = {https://arxiv.org/abs/2208.02755},
  note = {Source identifier: 2208.02755}
}