@misc{indiciae0f24735e7b7f,
  title = {Convolutional Ensembling based Few-Shot Defect Detection Technique},
  author = {Soumyajit Karmakar and Abeer Banerjee and Prashant Sadashiv Gidde and Sumeet Saurav and Sanjay Singh},
  year = {2022},
  doi = {10.1145/3571600.3571607},
  url = {https://arxiv.org/abs/2208.03288},
  note = {Source identifier: 2208.03288}
}