@misc{indiciaeb711de36a0b4,
  title = {The effect of fast noise on the fidelity of trapped-ions quantum gates},
  author = {Haim Nakav and Ran Finkelstein and Lee Peleg and Nitzan Akerman and Roee Ozeri},
  year = {2022},
  doi = {10.1103/physreva.107.042622},
  url = {https://arxiv.org/abs/2208.03570},
  note = {Source identifier: 2208.03570}
}