TY  - RPRT
TI  - The effect of fast noise on the fidelity of trapped-ions quantum gates
AU  - Haim Nakav
AU  - Ran Finkelstein
AU  - Lee Peleg
AU  - Nitzan Akerman
AU  - Roee Ozeri
PY  - 2022
DO  - 10.1103/physreva.107.042622
UR  - https://arxiv.org/abs/2208.03570
ID  - 2208.03570
ER  -