TY  - RPRT
TI  - Evolution of Ge wetting layers growing on smooth and rough Si (001) surfaces: isolated {105} facets as a kinetic factor of stress relaxation
AU  - Larisa V. Arapkina
AU  - Kirill V. Chizh
AU  - Vladimir P. Dubkov
AU  - Mikhail S. Storozhevykh
AU  - Vladimir A. Yuryev
PY  - 2022
DO  - 10.1016/j.apsusc.2022.155094
UR  - https://arxiv.org/abs/2208.04157
ID  - 2208.04157
ER  -