@misc{indiciae24116593df71,
  title = {Distinguishing the EH1 and S1 defects in n-type 4H-SiC by Laplace DLTS},
  author = {Tihomir Knežević and Tomislav Brodar and Vladimir Radulović and Luka Snoj and Takahiro Makino and Ivana Capan},
  year = {2022},
  doi = {10.35848/1882-0786/ac8f83},
  url = {https://arxiv.org/abs/2208.11578},
  note = {Source identifier: 2208.11578}
}