TY  - RPRT
TI  - Distinguishing the EH1 and S1 defects in n-type 4H-SiC by Laplace DLTS
AU  - Tihomir Knežević
AU  - Tomislav Brodar
AU  - Vladimir Radulović
AU  - Luka Snoj
AU  - Takahiro Makino
AU  - Ivana Capan
PY  - 2022
DO  - 10.35848/1882-0786/ac8f83
UR  - https://arxiv.org/abs/2208.11578
ID  - 2208.11578
ER  -