TY  - RPRT
TI  - Optical and microwave metrology at the 10-18 level with an Er/Yb:glass frequency comb
AU  - Nicholas V. Nardelli
AU  - Holly Leopardi
AU  - Thomas R. Schibli
AU  - Tara M. Fortier
PY  - 2022
UR  - https://arxiv.org/abs/2208.12869
ID  - 2208.12869
ER  -